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2017传感器与MEMS国际会议组委会
联系人:黄经理
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李昕欣

Xinxin Li

Director of State Key Laboratory of Transducer Technology in Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

Professor Chairman



Prof. Xinxin Li received the B.S. degree in semiconductor physics and devices from Tsinghua University, Beijing, China, in 1987. After worked in Shenyang Institute of Instrumentation Technology for five years as a Research Engineer, he resumed his graduate study and received the M.S. and Ph.D. degrees in microelectronics from Fudan University, Shanghai, China, in 1995 and 1997, respectively. Then, he sequentially worked in Hong Kong University of Science and Technology as a Research Associate, in Nanyang Technological University, Singapore, as a Research Fellow and, then, joined Tohoku University, Japan, as a Lecturer. From 2001 to now, he has been a professor and now serves as the Director of the State Key Lab of Transducer Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences. He is now also serving as Adjunct Professor in both Fudan University and Shanghai Jiaotong University. Prof. Li was granted the National Science Fund for Distinguished Young Scholar in 2007. His PhD student was awarded National Excellent PhD Dissertation in 2009. He is the laureate of the Chinese National Award for Technological Invention and the Shanghai Award for Technological Invention.His research interest has been in the fields of micro/nano sensors & actuators and micro/nano electromechanical systems (MEMS/NEMS). He has invented more than 70 patents and published more than 200 papers in referred journals and academic conferences (including more than 130 SCI journal papers). He has served as TPC members, respectively, for IEEE MEMS, Transducers and IEEE International Conference on Sensors. He is the editorial board member for Journal of Micromechanics and Microengineering. He has been invited to present invited talks in numerous international conferences and write topic-review papers for international journals.

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